{"product_id":"defects-in-microelectronic-materials-and-devices-paperback","title":"Defects in Microelectronic Materials and Devices - Paperback","description":"\u003cp\u003eby \u003cb\u003eDaniel M. Fleetwood\u003c\/b\u003e (Editor), \u003cb\u003eRonald D. Schrimpf\u003c\/b\u003e (Editor)\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eFocusing primarily on silicon-based microelectronics, \u003cstrong\u003eDefects in Microelectronic Materials and Devices\u003c\/strong\u003e provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.\u003c\/p\u003e\u003ch3\u003eAuthor Biography\u003c\/h3\u003e\u003cp\u003eDaniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 770\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 1.7 x 9.7 x 7 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e October 07, 2019\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":57240022188337,"sku":"9780367386399","price":167.36,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0958\/3486\/5969\/files\/9WJxSQHiLI9780367386399.webp?v=1793497953","url":"https:\/\/www.welibooks.com\/products\/defects-in-microelectronic-materials-and-devices-paperback","provider":"Welibooks","version":"1.0","type":"link"}